Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity

Simple item page
dc.contributor.authorMárquez, E.
dc.contributor.authorBlanco, E.
dc.contributor.authorMánuel, J.M.
dc.contributor.authorBallester, M.
dc.contributor.authorGarcía-Gurrea, M.
dc.contributor.authorRodríguez-Tapiador, M.I.
dc.contributor.authorFernández, S.
dc.contributor.authorWillomitser, F.
dc.contributor.authorKatsaggelos, A.K.
dc.date.accessioned2024-05-24T08:55:06Z
dc.date.available2024-05-24T08:55:06Z
dc.date.issued2023-12-19
dc.description.abstractCopper-nitride (Cu3N) semiconductor material is attracting much attention as a potential, next-generation thin-film solar light absorber in solar cells. In this communication, polycrystalline covalent Cu3N thin films were prepared using reactive-RF-magnetron-sputtering deposition, at room temperature, onto glass and silicon substrates. The very-broadband optical properties of the Cu3N thin film layers were studied by UV-MIR (0.2–40 μm) ellipsometry and optical transmission, to be able to achieve the goal of a low-cost absorber material to replace the conventional silicon. The reactive-RF-sputtered Cu3N films were also investigated by focused ion beam scanning electron microscopy and both FTIR and Raman spectroscopies. The less dense layer was found to have a value of the static refractive index of 2.304, and the denser film had a value of 2.496. The iso-absorption gap, E04, varied between approximately 1.3 and 1.8 eV and could be considered suitable as a solar light absorber.es_ES
dc.description.sponsorshipThis study received financial support from MCIN/AEI/10.13039/501100011033, under grant PID2019-109215RB-C42. This funding is part of the economic recovery investment and reform measures under the Next Generation EU.es_ES
dc.identifier.citationMárquez, E.; Blanco, E.; Mánuel, J.M.; Ballester, M.; García-Gurrea, M.; Rodríguez-Tapiador, M.I.; Fernández, S.M.; Willomitzer, F.; Katsaggelos, A.K. Mid-Infrared Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity. Coatings 2024, 14, 5. https://doi.org/10.3390/ coatings14010005es_ES
dc.identifier.issn2079-6412
dc.identifier.urihttps://hdl.handle.net/20.500.14855/3011
dc.language.isoenges_ES
dc.publisherOctavian Buiues_ES
dc.relation.ispartofseriesvolume;14
dc.rights.accessRightsopen accesses_ES
dc.subjectoptical propertieses_ES
dc.subjectthin filmses_ES
dc.subjectelectron microscopyes_ES
dc.subjectspectroscopic ellipsometryes_ES
dc.subjectsolar energyes_ES
dc.titleMid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosityes_ES
dc.typejournal articlees_ES

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
coatings-14-00005-v2.pdf
Size:
10.33 MB
Format:
Adobe Portable Document Format
Download

Collections

Artículos de Energía