Characterization of chalcopyrite Cu(In,Al)Se2 thin films grown by selenization of evaporated precursors

dc.contributor.authorMartín, Sofía
dc.contributor.authorGuillén, Cecilia
dc.date.accessioned2024-02-12T09:23:33Z
dc.date.available2024-02-12T09:23:33Z
dc.date.issued2011
dc.description.abstractChalcopyrite Cu(In,Al)Se2 (CIAS) thin films were prepared by a two-stage process onto soda-lime glass substrates. Different Cu/(Al+In) atomic ratios have been evaporated in a vacuum chamber to be subsequently heated with elemental selenium in a quasi closed graphite box at 530 ºC. The results on the dependence of the crystallite size, preferential orientation, roughness, optical transmittance and aluminium incorporation as a function of the stoichiometry have been studied, concludiong that a Cu/(Al+In) atomic proportion near the 1.07 value seems to be the best choice to favour crystalline CIAS formation without substantial CuSe secondary phase segregation.es_ES
dc.identifier.citationEnergy Procedia 10 (2011) 182–186es_ES
dc.identifier.doihttp://dx.doi.org/10.1016/j.egypro.2011.10.174
dc.identifier.urihttps://hdl.handle.net/20.500.14855/2597
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.rights.accessRightsopen accesses_ES
dc.subjectCu(In,Al)Se2es_ES
dc.subjectChalcopyritees_ES
dc.subjectEvaporationes_ES
dc.subjectSelenizationes_ES
dc.subjectRoughnesses_ES
dc.subjectStoichiometryes_ES
dc.titleCharacterization of chalcopyrite Cu(In,Al)Se2 thin films grown by selenization of evaporated precursorses_ES
dc.typeconference outputes_ES

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