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| Fecha de publicación | Título | Autor(es) | | 14-oct-2022 | Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Constants of Amorphous Semiconductor Thin Films | Ballester, M.; García, M.; Márquez, A.P.; Blanco, E.; Fernández, S.; Minkov, D.; Kattsaggelos, A.K.; Cossairt, O.; Willomitzer, F.; Márquez, E. |
| 2020 | Comparing metal oxide thin films as transparent p-type conductive electrodes | Guillén, Cecilia; Herrero, José |
| 19-dic-2023 | Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity | Márquez, E.; Blanco, E.; Mánuel, J.M.; Ballester, M.; García-Gurrea, M.; Rodríguez-Tapiador, M.I.; Fernández, S.; Willomitser, F.; Katsaggelos, A.K. |
| 29-oct-2021 | Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization | Márquez, E.; Ruíz-Pérez, J.J.; Ballester, M.; Márquez, A.P.; Blanco, E.; Minkov, D.; Fernández, S.; Saugar, E. |
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