(Institución)
 
 

Docu-menta >

Statistics

Total Visits

Views
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 278

Total Visits per Month

December 2024 January 2025 February 2025 March 2025 April 2025 May 2025 June 2025
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 36 19 30 21 22 25 4

File Downloads

Views
coatings-11-01324.pdf 129

Top Country Views

Views
España 278

Top City Views

Views
Madrid 278

 

Información y consultas: documenta@ciemat.es | Documento legal