(Institución)
 
 

Docu-menta >

Statistics

Total Visits

Views
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 28

Total Visits per Month

December 2023 January 2024 February 2024 March 2024 April 2024 May 2024 June 2024
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 0 0 0 0 0 16 12

File Downloads

Views
coatings-11-01324.pdf 17

Top Country Views

Views
España 28

Top City Views

Views
Madrid 28

 

Información y consultas: documenta@ciemat.es | Documento legal