(Institución)
 
 

Docu-menta >

Statistics

Total Visits

Views
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 456

Total Visits per Month

August 2025 September 2025 October 2025 November 2025 December 2025 January 2026 February 2026
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization 24 15 31 32 15 16 14

File Downloads

Views
coatings-11-01324.pdf 240

Top Country Views

Views
España 456

Top City Views

Views
Madrid 456

 

Información y consultas: documenta@ciemat.es | Documento legal