|
|
Docu-menta >
Statistics
Total Visits
|
Views |
|
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
|
335
|
Total Visits per Month
|
April 2025
|
May 2025
|
June 2025
|
July 2025
|
August 2025
|
September 2025
|
October 2025
|
|
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
|
20
|
38
|
35
|
16
|
21
|
21
|
11
|
File Downloads
|
Views |
|
materials-14-04681-v2.pdf
|
235
|
Top Country Views
Top City Views
|
