|
|
Docu-menta >
Statistics
Total Visits
|
Views |
|
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
|
204
|
Total Visits per Month
|
November 2024
|
December 2024
|
January 2025
|
February 2025
|
March 2025
|
April 2025
|
May 2025
|
|
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
|
15
|
13
|
19
|
14
|
17
|
20
|
11
|
File Downloads
|
Views |
|
materials-14-04681-v2.pdf
|
177
|
Top Country Views
Top City Views
|
