|
|
Docu-menta >
Buscar por Autor Ballester, M.
Mostrando resultados 1 a 6 de 6
| Fecha de publicación | Título | Autor(es) | | 14-oct-2022 | Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Constants of Amorphous Semiconductor Thin Films | Ballester, M.; García, M.; Márquez, A.P.; Blanco, E.; Fernández, S.; Minkov, D.; Kattsaggelos, A.K.; Cossairt, O.; Willomitzer, F.; Márquez, E. |
| 6-may-2023 | Complex dielectric function of H-free a-Si films: Photovoltaic light absorber | Márquez, E.; Ballester, M.; García, M.; Cintado, M.; Márquez, A.P.; Ruiz, J.J.; Fernández, S.M.; Blanco, E.; Willomitzer, F.; Katsaggelos, A.K. |
| 6-jul-2022 | Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated 𝑎-Si | Ballester, M.; Márquez, A.P.; García-Vázquez, C.; Díaz, J.M.; Blanco, E.; Minkov, D.; Fernández-Ruano, S.M.; Willomitzer, F.; Cossairt, O.; Márquez, E. |
| 19-dic-2023 | Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity | Márquez, E.; Blanco, E.; Mánuel, J.M.; Ballester, M.; García-Gurrea, M.; Rodríguez-Tapiador, M.I.; Fernández, S.; Willomitser, F.; Katsaggelos, A.K. |
| 29-oct-2021 | Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization | Márquez, E.; Ruíz-Pérez, J.J.; Ballester, M.; Márquez, A.P.; Blanco, E.; Minkov, D.; Fernández, S.; Saugar, E. |
| 25-jun-2023 | Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber | Márquez, E.; Blanco, E.; García-Gurrea, M.; Cintado Puerta, M.; Domínguez de la Vega, M.; Ballester, M.; Mánuel, J.M.; Rodríguez-Tapiador, M.I.; Fernández, S. |
Mostrando resultados 1 a 6 de 6
|
