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Buscar por Autor Minkov, D.
Mostrando resultados 1 a 4 de 4
| Fecha de publicación | Título | Autor(es) | | 14-oct-2022 | Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Constants of Amorphous Semiconductor Thin Films | Ballester, M.; García, M.; Márquez, A.P.; Blanco, E.; Fernández, S.; Minkov, D.; Kattsaggelos, A.K.; Cossairt, O.; Willomitzer, F.; Márquez, E. |
| 6-jul-2022 | Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated 𝑎-Si | Ballester, M.; Márquez, A.P.; García-Vázquez, C.; Díaz, J.M.; Blanco, E.; Minkov, D.; Fernández-Ruano, S.M.; Willomitzer, F.; Cossairt, O.; Márquez, E. |
| 19-ago-2021 | Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum | Minkov, D.; Márquez, E.; Angelov, G.; Fernandez Ruano, S.; Saugar, E. |
| 29-oct-2021 | Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization | Márquez, E.; Ruíz-Pérez, J.J.; Ballester, M.; Márquez, A.P.; Blanco, E.; Minkov, D.; Fernández, S.; Saugar, E. |
Mostrando resultados 1 a 4 de 4
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