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Buscar por Autor Saugar, E.
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| Fecha de publicación | Título | Autor(es) | | 19-ago-2021 | Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum | Minkov, D.; Márquez, E.; Angelov, G.; Fernandez Ruano, S.; Saugar, E. |
| 29-oct-2021 | Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization | Márquez, E.; Ruíz-Pérez, J.J.; Ballester, M.; Márquez, A.P.; Blanco, E.; Minkov, D.; Fernández, S.; Saugar, E. |
| 1-nov-2021 | Sputtered Non-Hydrogenated Amorphous Silicon as Alternative Absorber for Silicon Photovoltaic Technology | Fernández, S.; Gandía, J.J.; Saugar, E.; Gómez-Mancebo, M.B.; Canteli, David; Molpeceres, C. |
Mostrando resultados 1 a 3 de 3
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