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Título : | Characterization of chalcopyrite Cu(In,Al)Se2 thin films grown by selenization of evaporated precursors |
Autor : | Martín, Sofía Guillén, Cecilia |
Palabras clave : | Cu(In,Al)Se2 Chalcopyrite Evaporation Selenization Roughness Stoichiometry |
Fecha de publicación : | 2011 |
Editorial : | Elsevier |
Citación : | Energy Procedia 10 (2011) 182–186 |
Resumen : | Chalcopyrite Cu(In,Al)Se2 (CIAS) thin films were prepared by a two-stage process onto soda-lime glass substrates. Different Cu/(Al+In) atomic ratios have been evaporated in a vacuum chamber to be subsequently heated with elemental selenium in a quasi closed graphite box at 530 ºC. The results on the dependence of the crystallite size, preferential orientation, roughness, optical transmittance and aluminium incorporation as a function of the stoichiometry have been studied, concludiong that a Cu/(Al+In) atomic proportion near the 1.07 value seems to be the best choice to favour crystalline CIAS formation without substantial CuSe secondary phase segregation. |
URI : | http://documenta.ciemat.es/handle/123456789/2597 |
Aparece en las colecciones: | Artículos de Energía
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